|Content of teaching|
During this seminar, we will explore state-of-the-art for the power-efficient relia-bility and study different research solutions to improve soft-error resiliency in power efficient manner.
Among the other reliability threats due to physical limits of CMOS technology, radiation induced soft-errors or transient faults are also the most challenging threat to be handled.
Course of Studies: Informatik Diplom/Master; Informationswirtschaft Diplom/Master.
Power Efficient Reliability
|type:||Seminar (S)||links:||Registration Form|