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IEEE Design&Test Vol. 35, Issue 5

IEEE Design&Test Vol. 35, Issue 5
Speaker:
Special Issue on Self-Aware Systems on Chip
Location:
IEEE Explorer
Date: September/October
Design & Test

Magazine
Volume 35, Issue 5 (September/October)

Highlights
Special Issue on "Self-Aware Systems on Chip"
General Interest Paper by Alfonso Alongi, Giuseppe Vitello, Salvatore Vitabile and Vincenzo Conti, "An Empirical Set of Metrics for Embedded Systems Testing"
General Interest Paper by Pietro Fezzardi, Fabrizio Ferrandi and Christian Pilato, "Enabling Automated Bug Detection for IP-Based Designs Using High-Level Synthesis"
Tutorial by Felix Freiling, Tobias Groß, Tobias Latzo, Tilo Müller and Ralph Palutke, "Advances in Forensic Data Acquisition"
Conference Report by X. Sharon Hu "The 55th Design Automation Conference"

September/October 2018 Content


From the EIC
Self-Aware Systems on Chip Part II
  View full article (PDF).

Self-Aware Systems on Chip Part II
Guest Editors’ Introduction
  View full article (PDF).
Self-Test and Diagnosis for Self-Aware Systems
  Self-testing hardware has a long tradition as a complement to manufacturing testing based on test stimuli and response analysis. read more
View full article (PDF).
Self-Aware Network-on-Chip Control in Real-Time Systems
  This article identifies the contradictory needs for dynamic adaptations and full predictability in complex, exacting applications like autonomous driving. read more
View full article (PDF).
Self-Aware Thermal Management for High-Performance Computing Processors
  Editor’s note:Thermal management in high-performance multicore platforms has become exceedingly complex due to variable workloads, thermal heterogeneity, and long, thermal transients. read more.
View full article (PDF).
Run-Time Adaptive Power-Aware Reliability Management for Manycores
  Due to increasing process, voltage, and temperature (PVT) variability, reliability is becoming a growing worry. read more
View full article (PDF).

General Interest Papers
An Empirical Set of Metrics for Embedded Systems Testing
  Editor's note: Selecting the right platform for an embedded system is a challenging task, because there are no systematic methodologies for comprehensive evaluation and comparison of competing alternatives. read more
View full article (PDF).
Enabling Automated Bug Detection for IP-Based Designs Using High-Level Synthesis
  This article presents an automated approach for detecting system- level bugs in SoC designs that are composed of many IP blocks, without exposing sensitive information. read more
View full article (PDF).
 
Departments
Advances in Forensic Data Acquisition
  View full article (PDF).
The 55th Design Automation Conference
  View full article (PDF).
Self-Test and Self-Aware
  View full article (PDF).