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IEEE Design&Test Vol. 36, Issue 1

IEEE Design&Test Vol. 36, Issue 1
Speaker:
Special Section on Test
Location:

IEEE Explorer

Date: January/February
Design & Test

Magazine
Volume 36, Issue 1 (January/February)

Highlights
Special Section on "Test"
General Interest Paper by Shufan Yang, Zheqi Yu, "A Highly Integrated Hardware/Software Co-Design and Co-Verification Platform"
General Interest Paper by L. Pizano-Escalante, O. Longoria-Gandara, R. Parra-Michel, F. Peña-Campos, "Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects"
General Interest Paper by Donkyu Baek, Naehyuck Chang, Jaemin Kim, "Build Your Own EV: A Rapid Energy-Aware Synthesis of Electric Vehicles"
General Interest Paper by Seetal Potluri, Paul Pop, Jan Madsen, "Design-for-Testability of On-Chip Control in mVLSI Biochips"
General Interest Paper by Donkyu Baek, Hyung Gyu Lee, Naehyuck Chang, "SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter"
Perspective by Rajesh K. Gupta, Subhasish Mitra, Puneet Gupta, "Variability Expeditions: A Retrospective"
Conference Report by Soonhoi Ha, Petru Eles, "2018 Embedded Systems Week (ESWEEK) in Torino "

January/February 2019 Content


From the EIC
Special Section on Test
  View full article (PDF).

Special Section on Test
Randomized Checkpoints: A Practical Defense for Cyber-Physical Microfluidic Systems
  Attacks on cyber-physical microfluidic systems have emerged as a rising threat and call for an immediate solution. In this article, the authors survey different attacks on digital microfluidic biochips and propose to use randomized checkpoints as hardware-based countermeasures to address security vulnerabilities. read more.
View full article (PDF).
Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement
  Maintaining legacy systems, especially in military and aeronautic applications, can pose a significant challenge when system components become obsolete.. read more.
View full article (PDF).

General Interest Papers
A Highly Integrated Hardware/Software Co-Design and Co-Verification Platform
  This article presents a platform for hardware/software co-design and co-verification with a flexible hardware/software interface. read more
View full article (PDF).
Simulation Model to Predict BER Based on S-Parameters of High-Speed Interconnects
  This work aims to predict bounds on bit-error-rate performance of highspeed interconnects. read more
View full article (PDF).
Build Your Own EV: A Rapid Energy-Aware Synthesis of Electric Vehicles
  Electric vehicles (EVs) represent a quantum leap towards addressing climate-change effects and building a more sustainable environment. read more
View full article (PDF).
Design-for-Testability of On-Chip Control in mVLSI Biochips
  In this article, a team of researchers from Shiraz University and the Shahid Bahonar University of Kerman, Iran, investigates soft error rate (SER) estimation. read more
View full article (PDF).
SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter
  This article pioneers a self-powered, small-form-factor, light-weight, low-cost, and a patch-type ultraviolet (UV) meter for measuring the UV radiation with significant impact on human health and smart sensing. read more
View full article (PDF).
 
Departments
Perspective: Variability Expeditions: A Retrospective
  View full article (PDF).
2018 Embedded Systems Week (ESWEEK) in Torino
  View full article (PDF).
Is This a System?
  View full article (PDF).