Short Bio
Victor van Santen received the Dipl. Inform. (M.Sc.) degree in computer science in 2014 at the Karlsruhe Institute of Technology (KIT), where he is also currently pursuing his Ph.D at the Chair for Embedded Systems (CES). He is an IEEE Member. His research topics include microprocessor reliability estimation, circuit and transistor simulation, failure analysis and reliability estimation with a special interest in aging phenomena.
Publications
| Victor van Santen, Fu Florian Diep, Jörg Henkel, and Hussam Amrouch Massively Parallel Circuit Setup in GPU-SPICE in IEEE Transactions on Computers (TC), accepted to appear, 2020. |
| Victor M. van Santen, Hussam Amrouch, Poja Sharma and Jörg Henkel On the Workload Dependence of Self-Heating in FinFET Circuits in IEEE Transactions on Circuits and Systems II (TCAS-II), 2019. |
| Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, and Jörg Henkel Modeling the Interdependencies between Voltage Fluctuation and BTI Aging in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), 2019 |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel Modeling and Mitigating Time-Dependent Variability from the Physical Level to the Circuit Level in IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2019. |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel New Worst-Case Timing for Standard Cells under Aging Effects in IEEE Transactions on Device and Materials Reliability (TDMR), 2019. |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel Modeling and Evaluating the Gate Length Dependence of BTI in IEEE Transactions on Circuits and Systems II (TCAS-II), (accepted), 2018. |
| Victor M. van Santen, Javier Martin-Martinez, Hussam Amrouch, Montserrat Nafria, Jörg Henkel Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI and PV in IEEE Transactions on Circuits and Systems I (TCAS-I, Vol 65, Issue 1), pp. 293 - 306, DOI, PDF, Jan. 2018. |
| Hussam Amrouch, Victor M. van Santen, Jörg Henkel Interdependencies of Degradation Effects and their Impact on Computing in IEEE Design & Test, Vol.34, Issue 3, pp. 59-67, DOI, PDF, June 2017. |
| Victor M. van Santen, Simon Thomann, Chaitanya Pasupuleti, Paul R. Genssler, Narendra Gangwar, Uma Sharma, Jörg Henkel, Souvik Mahapatra, and Hussam Amrouch BTI and HCI Degradation in a Complete 32X64 bit SRAM Array including Sense Amplifyers and Write Drivers under Processor Activity in Proceedings of the IEEE 58th International Reliability Physics Symposium (IRPS'20), Dallas, Texas, U.S., April, 2020. |
| Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Chauhan and Jörg Henkel NCFET to Rescue Technology Scaling: Opportunities and Challenges (special session) in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, Jan. 13 - 16, 2020. |
| Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel and Hussam Amrouch Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology (special session) in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, Jan. 13 - 16, 2020. |
| Hussam Amrouch, Victor van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, and Jörg Henkel Reliability Challenges with Self-Heating in FinFET Technology in IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'19), (special session) 2019 |
| Hussam Amrouch, Victor M. van Santen and Jörg Henkel Estimating and Optimizing BTI Aging Effects: From Physics to CAD (Special Session) in IEEE/ACM 37th International Conference on Computer-Aided Design (ICCAD), San Diego, CA, November 5-8, 2018. |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE (special session) in 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Costa Brava, Spain, July 2-4, 2018 |
| Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martin-Martinez,Rosana Rodriguez, Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernandez, Jörg Henkel and Montserrat Nafria Weighted Time Lag Plot Defect Parameter Extraction and GPU-based BTI Modeling for BTI Variability in IEEE 55th International Reliability Physics Symposium (IRPS), San Francisco , CA, USA, March 11-15, 2018 |
| Hussam Amrouch, Subrat Mishra, Victor M. van Santen, Souvik Mahapatra, Jörg Henkel Impact of BTI on Dynamic and Static Power: From the Physical to Circuit Level in IEEE 55th International Reliability Physics Symposium (IRPS), Monterey, CA, USA, April 2-6, 2017. |
| Victor M. van Santen, Hussam Amrouch, Javier Martin-Martinez, Montserrat Nafria, Jörg Henkel Designing Guardbands for Instantaneous Aging Effects in ACM/EDAC/IEEE 53rd Design Automation Conference (DAC), Austin, TX, USA, June 5-9, 2016. |
| Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel Aging-Aware Voltage Scaling in IEEE/ACM 19th Design, Automation and Test in Europe Conference (DATE'16), Dresden, Germany, March 14-18, 2016. |
| Hussam Amrouch, Javier Martin-Martinez, Victor M. van Santen, Miquel Moras, Rosana Rodriguez, Montserrat Nafria, Jörg Henkel Connecting the Physical and Application Level Towards Grasping Aging Effects in IEEE 53rd International Reliability Physics Symposium (IRPS), Monterey, CA, USA, April 19-23, 2015. |
| Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel Towards Interdependencies of Aging Mechanisms in IEEE/ACM 33rd International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA, November, 2014. |
| Victor M. van Santen, Hussam Amrouch, Jörg Henkel Modeling Short and Long-term Effects of Aging from the Defect to Application Level (invited presentation) in Workshop on System-to-Silicon Performance Modeling and Analysis at the ACM/EDAC/IEEE 53rd Design Automation Conference (DAC). |
Teaching
