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van Santen

Dipl.-Inform. Victor van Santen
Scientist
room: 315.4
phone: +49 721 608-48926
fax: +49 721 608-43962
victor santenSen8∂kit edu


 Haid-und-Neu-Str. 7
Bldg. 07.21
76131 Karlsruhe

Short Bio

Victor van Santen received the Dipl. Inform. (M.Sc.) degree in computer science in 2014 at the Karlsruhe Institute of Technology (KIT), where he is also currently pursuing his Ph.D at the Chair for Embedded Systems (CES). He is an IEEE Member. His research topics include microprocessor reliability estimation, circuit and transistor simulation, failure analysis and reliability estimation with a special interest in aging phenomena.

 

Publications

Journals

  • Victor M. van Santen, Javier Martin-Martinez, Hussam Amrouch, Montserrat Nafria, Jörg Henkel
    Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI and PV
    in in IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), 2017
  • Hussam Amrouch, Victor M. van Santen, Jörg Henkel
    Interdependencies of Degradation Effects and their Impact on Computing
    in IEEE Design & Test (accepted).

 

Conferences

  • Hussam Amrouch, Subrat Mishra, Victor M. van Santen, Souvik Mahapatra, Jörg Henkel
    Impact of BTI on Dynamic and Static Power: From the Physical to Circuit Level
    in IEEE 55th International Reliability Physics Symposium (IRPS), Monterey, CA, USA, April 2-6, 2017.
  • Victor M. van Santen, Hussam Amrouch, Javier Martin-Martinez, Montserrat Nafria, Jörg Henkel
    Designing Guardbands for Instantaneous Aging Effects
    in ACM/EDAC/IEEE 53rd Design Automation Conference (DAC), Austin, TX, USA, June 5-9, 2016.
  • Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
    Aging-Aware Voltage Scaling
    in IEEE/ACM 19th Design, Automation and Test in Europe Conference (DATE'16), Dresden, Germany, March 14-18, 2016.
  • Hussam Amrouch, Javier Martin-Martinez, Victor M. van Santen, Miquel Moras, Rosana Rodriguez, Montserrat Nafria, Jörg Henkel
    Connecting the Physical and Application Level Towards Grasping Aging Effects
    in IEEE 53rd International Reliability Physics Symposium (IRPS), Monterey, CA, USA, April 19-23, 2015.
  • Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel
    Towards Interdependencies of Aging Mechanisms
    in IEEE/ACM 33rd International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA, November, 2014.

 

Workshops

  • Victor M. van Santen, Hussam Amrouch, Jörg Henkel
    Modeling Short and Long-term Effects of Aging from the Defect to Application Level (invited presentation)
    in Workshop on System-to-Silicon Performance Modeling and Analysis at the ACM/EDAC/IEEE 53rd Design Automation Conference (DAC).

 

Teaching

 

Student Theses

Ongoing projects

NameType of
work		TitelMentor
Brinkmann, SvenDiploma thesisAccelerated Reliability Estimtationvan Santen, Victor / Amrouch, Hussam
Diep, Fu LamDiploma thesisHigh Performance Reliability Estimation of Circuits with CUDAvan Santen, Victor / Amrouch, Hussam
Joe, JerinInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor
Mishra, SubratInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor
Roether, SebastianDiploma thesisParallel Reliability Estimation of Circuitsvan Santen, Victor / Amrouch, Hussam

Finished projects

Nr.NameType of workTitelMentorCompletion date
11Bücher, TimBachelor thesisMeasuring Aging-induced Degradation in MicroprocessorsAmrouch, Hussam / van Santen, Victor2017-05-09
10Milev, DimitarMaster thesisGPU-based Implementation for State-of-the-Art MOSFET Compact ModellingAmrouch, Hussam / van Santen, Victor2017-05-08
9Naqvi, Syed Mohsin AliMaster thesisCircuits ReliabilityAmrouch, Hussam / van Santen, Victor2016-10-01
8Rostek, Daniela JacintaStudent research projectGraphical User Interface for Reliability Estimation Toolvan Santen, Victor / Amrouch, Hussam 2016-09-30
7Aazmi, AbdellatifInternshipEvaluating Aging in CircuitsAmrouch, Hussam / van Santen, Victor2016-08-31
6Eisele, Max CamilloBachelor thesisFast, yet Accurate Implementation for Advanced Reliability ModelingAmrouch, Hussam / van Santen, Victor2016-08-11
5Skinder, MichaelMaster thesisEvaluating the Mutual Influence between the Application and Physical Level on ReliabilityAmrouch, Hussam / van Santen, Victor2016-03-07
4List, ChristianDiploma thesisEvaluating the Impact of Applications on Simulating Aging EffectsAmrouch, Hussam / van Santen, Victor2016-03-07
3Bhat, RajeshInternshipCUDA Programming for Rapid Reliability EstimationsAmrouch, Hussam / van Santen, Victor2016-02-29
2Aqqad, RamiMaster thesisOpenCL Programming for Circuits ReliabilityAmrouch, Hussam / van Santen, Victor2015-12-01
1Khaleghi, BehnamInternshipReliability of SRAM Cells under different Physical PhenomenaAmrouch, Hussam / van Santen, Victor2014-09-30

Available theses

Abbreviation: D - Diploma Thesis, M - Master Thesis, S - Student Work, B - Bachelor Thesis.


TopicType of workMentor
Degradation Effects in Microprocessors ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam
Reliability of Electrical Circuits ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam
OpenCL/CUDA Programing for Reliability Analysis ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam