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Chair for Embedded Systems
Chair for Embedded Systems
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    van Santen

    Dipl.-Inform. Victor van Santen

    • Haid-und-Neu-Str. 7
      Bldg. 07.21
      76131 Karlsruhe

    Short Bio

    Victor van Santen received the Dipl. Inform. (M.Sc.) degree in computer science in 2014 at the Karlsruhe Institute of Technology (KIT), where he is also currently pursuing his Ph.D at the Chair for Embedded Systems (CES). He is an IEEE Member. His research topics include microprocessor reliability estimation, circuit and transistor simulation, failure analysis and reliability estimation with a special interest in aging phenomena.

     

    Teaching

     

    Publications

    Journals
    Victor van Santen, Fu Florian Diep, Jörg Henkel, and Hussam Amrouch
    Massively Parallel Circuit Setup in GPU-SPICE
    in IEEE Transactions on Computers (TC), early access 2020.

    Victor M. van Santen, Hussam Amrouch, Poja Sharma and Jörg Henkel
    On the Workload Dependence of Self-Heating in FinFET Circuits
    in IEEE Transactions on Circuits and Systems II (TCAS-II), DOI, PDF, Video, early access 2020.

    Victor M. van Santen, Hussam Amrouch, Jörg Henkel
    Modeling and Evaluating the Gate Length Dependence of BTI
    in IEEE Trans. on Circuits and Systems (Vol 66, Issue 9), DOI, PDF, Sep 2019.

    Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, and Jörg Henkel
    Modeling the Interdependences between Voltage Fluctuation and BTI Aging
    in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), DOI, PDF, Jul 2019.

    Victor M. van Santen, Hussam Amrouch and Jörg Henkel
    Modeling and Mitigating Time-Dependent Variability from the Physical Level to the Circuit Level
    in IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), DOI, PDF, Jul 2019.

    Victor M. van Santen, Hussam Amrouch and Jörg Henkel
    New Worst-Case Timing for Standard Cells under Aging Effects
    in IEEE Transactions on Device and Materials Reliability (T-DMR), DOI, PDF, Mar 2019.

    Victor M. van Santen, Javier Martin-Martinez, Hussam Amrouch, Montserrat Nafria, Jörg Henkel
    Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI and PV
    in IEEE Transactions on Circuits and Systems I (TCAS-I, Vol 65, Issue 1, DOI, PDF, Jan 2018.

    Hussam Amrouch, Victor M. van Santen, Jörg Henkel
    Interdependencies of Degradation Effects and their Impact on Computing
    in IEEE Design & Test, Vol.34, Issue 3, DOI, PDF, Jun 2017.

    Conferences
      Victor M. van Santen, S. Thomann, C. Pasupuleti, P. Genssler, N. Gangwar, U. Sharma, J. Henkel, S. Mahapatra, and H. Amrouch
      BTI and HCD Degradation in a Complete 32X64 bit SRAM Array including Sense Amplifyers and Write Drivers under Processor Activity
      in Proceedings of the IEEE 58th International Reliability Physics Symposium (IRPS'20), Dallas, Texas, USA, DOI, PDF, Apr 2020.

      Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel and Hussam Amrouch
      Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology (special session)
      in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020.

      Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Chauhan and Jörg Henkel
      NCFET to Rescue Technology Scaling: Opportunities and Challenges (special session)
      in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020.

      Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, and Jörg Henkel
      Reliability Challenges with Self-Heating and Aging in FinFET Technology
      in IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'19), (special session), Rhodes Island, Greece, DOI, PDF, Jul 1-3 2019.

      Hussam Amrouch, Victor M. van Santen and Jörg Henkel
      Estimating and Optimizing BTI Aging Effects: From Physics to CAD (Special Session)
      in IEEE/ACM 37th International Conference on Computer-Aided Design (ICCAD), San Diego, CA, DOI, PDF, Nov 5-8 2018.

      Victor M. van Santen, Hussam Amrouch and Jörg Henkel
      Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE (Special Session)
      in 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Costa Brava, Spain, DOI, PDF, Jul 2-4 2018.

      Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martin-Martinez,Rosana Rodriguez, Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernandez, Jörg Henkel and Montserrat Nafria
      Weighted Time Lag Plot Defect Parameter Extraction and GPU-based BTI Modeling for BTI Variability
      in IEEE 55th International Reliability Physics Symposium (IRPS), San Francisco , CA, USA, DOI, PDF, Mar 11-15 2018.

      Hussam Amrouch, Subrat Mishra, Victor M. van Santen, Souvik Mahapatra, Jörg Henkel
      Impact of BTI on Dynamic and Static Power: From the Physical to Circuit Level
      in IEEE/ACM 20th Design, Automation and Test in Europe Conference (DATE'17), Lausanne, Switzerland, DOI, PDF, Mar 27-31 2017.

      Victor M. van Santen, Hussam Amrouch, Javier Martin-Martinez, Montserrat Nafria, Jörg Henkel
      Designing Guardbands for Instantaneous Aging Effects
      in ACM/EDAC/IEEE 53rd Design Automation Conference (DAC'16), Austin, TX, USA, DOI, PDF, Jun 5-9 2016.

      Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
      Aging-Aware Voltage Scaling
      in IEEE/ACM 19th Design, Automation and Test in Europe Conference (DATE'16), Dresden, Germany, DOI, PDF, Mar 14-18 2016.

      Hussam Amrouch, Javier Martin-Martinez, Victor M. van Santen, Miquel Moras, Rosana Rodriguez, Montserrat Nafria and Jörg Henkel
      Connecting the Physical and Application Level Towards Grasping Aging Effects
      in IEEE 53rd International Reliability Physics Symposium (IRPS), Monterey, CA, USA, DOI, PDF, Apr 19-23 2015.

      Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel
      Towards Interdependencies of Aging Mechanisms
      in IEEE/ACM 33rd International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA, DOI, PDF, Nov 3-6 2014.

    Workshops
      Victor M. van Santen, Hussam Amrouch, Jörg Henkel
      Modeling Short and Long-term Effects of Aging from the Defect to Application Level (invited presentation)
      in Workshop on System-to-Silicon Performance Modeling and Analysis at the ACM/EDAC/IEEE 53rd Design Automation Conference (DAC) , June 5-9 2016.

    Student Theses

    Available Theses

    Abbreviation: D - Diploma Thesis, M - Master Thesis, S - Student Work, B - Bachelor Thesis.


    Topic Type of work Mentor
    Degradation Effects in Microprocessors ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam
    OpenCL/CUDA Programing for Reliability Analysis ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam
    Reliability of Electrical Circuits ( PDF )M/Bvan Santen, Victor / Amrouch, Hussam

    Ongoing projects
    Name Type of
    work    		 Titel Mentor
    List, Leon FelixBachelor thesisImproved Aging Modeling for Circuit Reliability Evaluationsvan Santen, Victor / Amrouch, Hussam
    Schillinger, LindaMaster thesisThe Impact of Self-Heating on Circuitsvan Santen, Victor / Amrouch, Hussam

    Finished projects
    Name Type of work TitelMentor Completion date
    Prinz, JannikMaster thesisInferring Transistor Compact Models with Neural NetworksAmrouch, Hussam / van Santen, Victor20-05-27
    Walner, AlbertMaster thesisJust-In-Time Compilation for the Circuit Simulator GPU-SPICE on the CUDA platformvan Santen, Victor / Amrouch, Hussam19-09-27
    Thomann, SimonBachelor thesisReliability Analysis of SRAM Circuits in Conventional and Emerging Technologiesvan Santen, Victor / Amrouch, Hussam19-09-12
    Meinschäfer, MichaelBachelor thesisModeling Self-Heating Dependencies in FinFET Transistorsvan Santen, Victor / Amrouch, Hussam19-05-17
    Banscher, FlorianBachelor thesisModeling Self-Heating Effects in FinFET Technologyvan Santen, Victor / Amrouch, Hussam19-02-28
    Hamada, IslamBachelor thesisHigh Performance Circuit Simulationsvan Santen, Victor / Amrouch, Hussam18-08-24
    Joe, JerinInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor18-05-31
    Klemme, FlorianMaster thesisReliability Analysis of Circuits under Variability Effectsvan Santen, Victor / Amrouch, Hussam18-05-14
    Schneider, NathanaelBachelor thesisHigh Performance Circuit Simulationsvan Santen, Victor / Amrouch, Hussam18-04-30
    Mishra, SubratInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor17-12-31
    Diep, Fu Lam FlorianDiploma thesisHigh Performance Reliability Estimation of Circuits with CUDAvan Santen, Victor / Amrouch, Hussam17-09-30
    Roether, SebastianDiploma thesisA Novel Approach to Standard Cell Simulation in SPICE using Equivalence Classesvan Santen, Victor / Amrouch, Hussam17-09-30
    Brinkmann, SvenDiploma thesisFast, yet Accurate BTI Variability Evaluation at the Physical and Device Levelsvan Santen, Victor / Amrouch, Hussam17-07-06
    Bücher, TimBachelor thesisMeasuring Aging-induced Degradation in MicroprocessorsAmrouch, Hussam / van Santen, Victor17-05-09
    Milev, DimitarMaster thesisGPU-based Implementation for State-of-the-Art MOSFET Compact ModellingAmrouch, Hussam / van Santen, Victor17-05-08
    Naqvi, Syed Mohsin AliMaster thesisCircuits ReliabilityAmrouch, Hussam / van Santen, Victor16-10-01
    Rostek, Daniela JacintaStudent research projectGraphical User Interface for Reliability Estimation Toolvan Santen, Victor / Amrouch, Hussam 16-09-30
    Aazmi, AbdellatifInternshipEvaluating Aging in CircuitsAmrouch, Hussam / van Santen, Victor16-08-31
    Eisele, Max CamilloBachelor thesisFast, yet Accurate Implementation for Advanced Reliability ModelingAmrouch, Hussam / van Santen, Victor16-08-11
    Skinder, MichaelMaster thesisEvaluating the Mutual Influence between the Application and Physical Level on ReliabilityAmrouch, Hussam / van Santen, Victor16-03-07
    List, ChristianDiploma thesisEvaluating the Impact of Applications on Simulating Aging EffectsAmrouch, Hussam / van Santen, Victor16-03-07
    Bhat, RajeshInternshipCUDA Programming for Rapid Reliability EstimationsAmrouch, Hussam / van Santen, Victor16-02-29
    Aqqad, RamiMaster thesisOpenCL Programming for Circuits ReliabilityAmrouch, Hussam / van Santen, Victor15-12-01
    Khaleghi, BehnamInternshipReliability of SRAM Cells under different Physical PhenomenaAmrouch, Hussam / van Santen, Victor14-09-30