DAC 2020
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ACM/IEEE Machine Learning for CAD
2nd ACM/IEEE Workshop on Machine Learning for CAD (MLCAD) |
The IEEE Design&Test Magazine
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The IEEE Design&Test Magazine Editor-in-Chief: Prof. Jörg Henkel Website Recent Issue Submit a paper |
Major Projects
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SFB Transregio 89 - Invasive computing |
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DFG SPP 1500 - Dependable Embedded Systems |