van Santen

Dipl.-Inform. Victor van Santen

  • Haid-und-Neu-Str. 7
    Bldg. 07.21
    76131 Karlsruhe

Short Bio

Victor van Santen received the Dipl. Inform. (M.Sc.) degree in computer science in 2014 at the Karlsruhe Institute of Technology (KIT), where he is also currently pursuing his Ph.D at the Chair for Embedded Systems (CES). He is an IEEE Member. His research topics include microprocessor reliability estimation, circuit and transistor simulation, failure analysis and reliability estimation with a special interest in aging phenomena.

 

Teaching

 

Publications

Journals
Hussam Amrouch, Paul Genßler, Victor M. van Santen, Jörg Henkel
On the Reliability of FeFET On-Chip Memory
in IEEE Transactions on Computers, DOI, PDF, early access 2021.
Sami Salamin; Victor M. Van Santen; Martin Rapp; Jörg Henkel; Hussam Amrouch
Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient
in IEEE Access, DOI, PDF, Feb 2021.
Victor van Santen, Fu Florian Diep, Jörg Henkel, and Hussam Amrouch
Massively Parallel Circuit Setup in GPU-SPICE
in IEEE Transactions on Computers (TC), DOI, PDF, early access 2020.
Victor M. van Santen, Hussam Amrouch, Poja Sharma and Jörg Henkel
On the Workload Dependence of Self-Heating in FinFET Circuits
in IEEE Transactions on Circuits and Systems II (TCAS-II), DOI, PDF, Oct 2020.
Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Modeling and Evaluating the Gate Length Dependence of BTI
in IEEE Trans. on Circuits and Systems (Vol 66, Issue 9), DOI, PDF, Sep 2019.
Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, and Jörg Henkel
Modeling the Interdependences between Voltage Fluctuation and BTI Aging
in IEEE Transactions on Very Large Scale Integration Systems (TVLSI), DOI, PDF, Jul 2019.
Victor M. van Santen, Hussam Amrouch and Jörg Henkel
Modeling and Mitigating Time-Dependent Variability from the Physical Level to the Circuit Level
in IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I), DOI, PDF, Jul 2019.
Victor M. van Santen, Hussam Amrouch and Jörg Henkel
New Worst-Case Timing for Standard Cells under Aging Effects
in IEEE Transactions on Device and Materials Reliability (T-DMR), DOI, PDF, Mar 2019.
Victor M. van Santen, Javier Martin-Martinez, Hussam Amrouch, Montserrat Nafria, Jörg Henkel
Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI and PV
in IEEE Transactions on Circuits and Systems I (TCAS-I, Vol 65, Issue 1, DOI, PDF, Jan 2018.
Hussam Amrouch, Victor M. van Santen, Jörg Henkel
Interdependencies of Degradation Effects and their Impact on Computing
in IEEE Design & Test, Vol.34, Issue 3, DOI, PDF, Jun 2017.
Conferences
Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch
Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities
in IEEE/ACM 39th International Conference On Computer Aided Design (ICCAD), Virtual Conference, DOI, PDF, Nov 2-5 2020.
Victor M. van Santen, S. Thomann, C. Pasupuleti, P. Genssler, N. Gangwar, U. Sharma, J. Henkel, S. Mahapatra, and H. Amrouch
BTI and HCD Degradation in a Complete 32X64 bit SRAM Array including Sense Amplifyers and Write Drivers under Processor Activity
in Proceedings of the IEEE 58th International Reliability Physics Symposium (IRPS'20), Dallas, Texas, USA, DOI, PDF, Apr 2020.
Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel and Hussam Amrouch
Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology (special session)
in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020.
Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Chauhan and Jörg Henkel
NCFET to Rescue Technology Scaling: Opportunities and Challenges (special session)
in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020.
Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, and Jörg Henkel
Reliability Challenges with Self-Heating and Aging in FinFET Technology
in IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'19), (special session), Rhodes Island, Greece, DOI, PDF, Jul 1-3 2019.
Hussam Amrouch, Victor M. van Santen and Jörg Henkel
Estimating and Optimizing BTI Aging Effects: From Physics to CAD (Special Session)
in IEEE/ACM 37th International Conference on Computer-Aided Design (ICCAD), San Diego, CA, DOI, PDF, Nov 5-8 2018.
Victor M. van Santen, Hussam Amrouch and Jörg Henkel
Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE (Special Session)
in 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Costa Brava, Spain, DOI, PDF, Jul 2-4 2018.
Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martin-Martinez,Rosana Rodriguez, Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernandez, Jörg Henkel and Montserrat Nafria
Weighted Time Lag Plot Defect Parameter Extraction and GPU-based BTI Modeling for BTI Variability
in IEEE 55th International Reliability Physics Symposium (IRPS), San Francisco , CA, USA, DOI, PDF, Mar 11-15 2018.
Hussam Amrouch, Subrat Mishra, Victor M. van Santen, Souvik Mahapatra, Jörg Henkel
Impact of BTI on Dynamic and Static Power: From the Physical to Circuit Level
in IEEE/ACM 20th Design, Automation and Test in Europe Conference (DATE'17), Lausanne, Switzerland, DOI, PDF, Mar 27-31 2017.
Victor M. van Santen, Hussam Amrouch, Javier Martin-Martinez, Montserrat Nafria, Jörg Henkel
Designing Guardbands for Instantaneous Aging Effects
in ACM/EDAC/IEEE 53rd Design Automation Conference (DAC'16), Austin, TX, USA, DOI, PDF, Jun 5-9 2016.
Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel
Aging-Aware Voltage Scaling
in IEEE/ACM 19th Design, Automation and Test in Europe Conference (DATE'16), Dresden, Germany, DOI, PDF, Mar 14-18 2016.
Hussam Amrouch, Javier Martin-Martinez, Victor M. van Santen, Miquel Moras, Rosana Rodriguez, Montserrat Nafria and Jörg Henkel
Connecting the Physical and Application Level Towards Grasping Aging Effects
in IEEE 53rd International Reliability Physics Symposium (IRPS), Monterey, CA, USA, DOI, PDF, Apr 19-23 2015.
Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel
Towards Interdependencies of Aging Mechanisms
in IEEE/ACM 33rd International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA, DOI, PDF, Nov 3-6 2014.
Books / Book Chapter
Victor M. van Santen, Hussam Amrouch, Thomas Wild, Jörg Henkel, Andreas Herkersdorf
Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs
Chapter in "Dependable Embedded Systems", Springer International Publishing, DOI, PDF, 2020.
Workshop
Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Modeling Short and Long-term Effects of Aging from the Defect to Application Level (invited presentation)
in Workshop on System-to-Silicon Performance Modeling and Analysis at the ACM/EDAC/IEEE 53rd Design Automation Conference (DAC) , June 5-9 2016.

Student Theses

Available Theses

Abbreviation: D - Diploma Thesis, M - Master Thesis, S - Student Work, B - Bachelor Thesis.

Topic Type of work Mentor

Ongoing projects
Name Type of
work
Titel Mentor
List, Leon FelixBachelor thesisImproved Aging Modeling for Circuit Reliability Evaluationsvan Santen, Victor / Amrouch, Hussam
Schillinger, LindaMaster thesisThe Impact of Self-Heating on Circuitsvan Santen, Victor / Amrouch, Hussam

Finished projects
Name Type of work TitelMentor Completion date
Prinz, JannikMaster thesisInferring Transistor Compact Models with Neural NetworksAmrouch, Hussam / van Santen, Victor20-05-27
Walner, AlbertMaster thesisJust-In-Time Compilation for the Circuit Simulator GPU-SPICE on the CUDA platformvan Santen, Victor / Amrouch, Hussam19-09-27
Thomann, SimonBachelor thesisReliability Analysis of SRAM Circuits in Conventional and Emerging Technologiesvan Santen, Victor / Amrouch, Hussam19-09-12
Meinschäfer, MichaelBachelor thesisModeling Self-Heating Dependencies in FinFET Transistorsvan Santen, Victor / Amrouch, Hussam19-05-17
Banscher, FlorianBachelor thesisModeling Self-Heating Effects in FinFET Technologyvan Santen, Victor / Amrouch, Hussam19-02-28
Hamada, IslamBachelor thesisHigh Performance Circuit Simulationsvan Santen, Victor / Amrouch, Hussam18-08-24
Joe, JerinInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor18-05-31
Klemme, FlorianMaster thesisReliability Analysis of Circuits under Variability Effectsvan Santen, Victor / Amrouch, Hussam18-05-14
Schneider, NathanaelBachelor thesisHigh Performance Circuit Simulationsvan Santen, Victor / Amrouch, Hussam18-04-30
Mishra, SubratInternshipDependable HardwareAmrouch, Hussam / van Santen, Victor17-12-31
Diep, Fu Lam FlorianDiploma thesisHigh Performance Reliability Estimation of Circuits with CUDAvan Santen, Victor / Amrouch, Hussam17-09-30
Roether, SebastianDiploma thesisA Novel Approach to Standard Cell Simulation in SPICE using Equivalence Classesvan Santen, Victor / Amrouch, Hussam17-09-30
Brinkmann, SvenDiploma thesisFast, yet Accurate BTI Variability Evaluation at the Physical and Device Levelsvan Santen, Victor / Amrouch, Hussam17-07-06
Bücher, TimBachelor thesisMeasuring Aging-induced Degradation in MicroprocessorsAmrouch, Hussam / van Santen, Victor17-05-09
Milev, DimitarMaster thesisGPU-based Implementation for State-of-the-Art MOSFET Compact ModellingAmrouch, Hussam / van Santen, Victor17-05-08
Naqvi, Syed Mohsin AliMaster thesisCircuits ReliabilityAmrouch, Hussam / van Santen, Victor16-10-01
Rostek, Daniela JacintaStudent research projectGraphical User Interface for Reliability Estimation Toolvan Santen, Victor / Amrouch, Hussam 16-09-30
Aazmi, AbdellatifInternshipEvaluating Aging in CircuitsAmrouch, Hussam / van Santen, Victor16-08-31
Eisele, Max CamilloBachelor thesisFast, yet Accurate Implementation for Advanced Reliability ModelingAmrouch, Hussam / van Santen, Victor16-08-11
Skinder, MichaelMaster thesisEvaluating the Mutual Influence between the Application and Physical Level on ReliabilityAmrouch, Hussam / van Santen, Victor16-03-07
List, ChristianDiploma thesisEvaluating the Impact of Applications on Simulating Aging EffectsAmrouch, Hussam / van Santen, Victor16-03-07
Bhat, RajeshInternshipCUDA Programming for Rapid Reliability EstimationsAmrouch, Hussam / van Santen, Victor16-02-29
Aqqad, RamiMaster thesisOpenCL Programming for Circuits ReliabilityAmrouch, Hussam / van Santen, Victor15-12-01
Khaleghi, BehnamInternshipReliability of SRAM Cells under different Physical PhenomenaAmrouch, Hussam / van Santen, Victor14-09-30