Short Bio
Victor van Santen received the Dipl. Inform. (M.Sc.) degree in computer science in 2014 at the Karlsruhe Institute of Technology (KIT), where he is also currently pursuing his Ph.D at the Chair for Embedded Systems (CES). He is an IEEE Member. His research topics include microprocessor reliability estimation, circuit and transistor simulation, failure analysis and reliability estimation with a special interest in aging phenomena.
Teaching
- Seminar Dependability in Internet of Things (IoT)
Publications
| Journals | |
|---|---|
| Victor van Santen, Fu Florian Diep, Jörg Henkel, and Hussam Amrouch Massively Parallel Circuit Setup in GPU-SPICE in IEEE Transactions on Computers (TC, Volume 72, Issue 8), DOI, PDF, Aug 2023. | |
| Hussam Amrouch, Paul Genßler, Victor M. van Santen, Jörg Henkel On the Reliability of FeFET On-Chip Memory in IEEE Transactions on Computers (Volume 71, Issue 4), DOI, PDF, Apr 2022. | |
| Divya Praneetha Ravipati, Rajesh Kedia, Victor M. van Santen, Jörg Henkel, Preeti Ranjan Panda, Hussam Amrouch FN-CACTI: Advanced CACTI for FinFET and NC-FinFET Technologies in IEEE Transactions on Very Large Scale Integration (VLSI) Systems (Volume 30, Issue 3), DOI, PDF, Mar 2022. | |
| Sami Salamin; Victor M. Van Santen; Martin Rapp; Jörg Henkel; Hussam Amrouch Minimizing Excess Timing Guard Banding Under Transistor Self-Heating Through Biasing at Zero-Temperature Coefficient in IEEE Access (Volume 9), DOI, PDF, Feb 2021. | |
| Victor M. van Santen, Hussam Amrouch, Poja Sharma and Jörg Henkel On the Workload Dependence of Self-Heating in FinFET Circuits in IEEE Transactions on Circuits and Systems II (TCAS-II) (Volume 67, Issue 10), DOI, PDF, Oct 2020. |   |
| Victor M. van Santen, Hussam Amrouch, Jörg Henkel Modeling and Evaluating the Gate Length Dependence of BTI in IEEE Trans. on Circuits and Systems (Volume 66, Issue 9), DOI, PDF, Sep 2019. | |
| Sami Salamin, Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, and Jörg Henkel Modeling the Interdependences between Voltage Fluctuation and BTI Aging in IEEE Transactions on Very Large Scale Integration Systems (TVLSI) (Volume 27, Issue 7), DOI, PDF, Jul 2019. | |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel Modeling and Mitigating Time-Dependent Variability from the Physical Level to the Circuit Level in IEEE Transactions on Circuits and Systems I: Regular Papers (TCAS-I) (Volume 66, Issue 7), DOI, PDF, Jul 2019. | |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel New Worst-Case Timing for Standard Cells under Aging Effects in IEEE Transactions on Device and Materials Reliability (T-DMR) (Volume 19, Issue 1), DOI, PDF, Mar 2019. | |
| Victor M. van Santen, Javier Martin-Martinez, Hussam Amrouch, Montserrat Nafria, Jörg Henkel Reliability in Super- and Near-Threshold Computing: A Unified Model of RTN, BTI and PV in IEEE Transactions on Circuits and Systems I (TCAS-I) (Volume 65, Issue 1), DOI, PDF, Jan 2018. | |
| Hussam Amrouch, Victor M. van Santen, Jörg Henkel Interdependencies of Degradation Effects and their Impact on Computing in IEEE Design & Test (Volume 34, Issue 3), DOI, PDF, Jun 2017. | |
| Conferences | |
|---|---|
| Victor M. van Santen, Simon Thomann, Yogesh S. Chauchan, Jörg Henkel, Hussam Amrouch Reliability-Driven Voltage Optimization for NCFET-based SRAM Memory Banks in IEEE 39th VLSI Test Symposium (VTS), DOI, PDF, Apr 25-28 2021. | |
| Florian Klemme, Jannik Prinz, Victor M. van Santen, Jörg Henkel, Hussam Amrouch Modeling Emerging Technologies using Machine Learning: Challenges and Opportunities in IEEE/ACM 39th International Conference On Computer Aided Design (ICCAD), Virtual Conference, DOI, PDF, Nov 2-5 2020. | |
| Victor M. van Santen, S. Thomann, C. Pasupuleti, P. Genssler, N. Gangwar, U. Sharma, J. Henkel, S. Mahapatra, and H. Amrouch BTI and HCD Degradation in a Complete 32X64 bit SRAM Array including Sense Amplifyers and Write Drivers under Processor Activity in Proceedings of the IEEE 58th International Reliability Physics Symposium (IRPS'20), Dallas, Texas, USA, DOI, PDF, Apr 2020. | |
| Victor M. van Santen, Paul R. Genssler, Om Prakash, Simon Thomann, Jörg Henkel and Hussam Amrouch Impact of Self-Heating on Performance, Power and Reliability in FinFET Technology (special session) in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020. | |
| Hussam Amrouch, Victor M. van Santen, Girish Pahwa, Yogesh Chauhan and Jörg Henkel NCFET to Rescue Technology Scaling: Opportunities and Challenges (special session) in 25th Asia and South Pacific Design Automation Conference, ASP-DAC, Beijing, China, DOI, PDF, Jan 13-16 2020. | |
| Hussam Amrouch, Victor M. van Santen, Om Prakash, Hammam Kattan, Sami Salamin, Simon Thomann, and Jörg Henkel Reliability Challenges with Self-Heating and Aging in FinFET Technology in IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS'19), (special session), Rhodes Island, Greece, DOI, PDF, Jul 1-3 2019. | |
| Hussam Amrouch, Victor M. van Santen and Jörg Henkel Estimating and Optimizing BTI Aging Effects: From Physics to CAD (Special Session) in IEEE/ACM 37th International Conference on Computer-Aided Design (ICCAD), San Diego, CA, DOI, PDF, Nov 5-8 2018. | |
| Victor M. van Santen, Hussam Amrouch and Jörg Henkel Reliability Estimations of Large Circuits in Massively-Parallel GPU-SPICE (Special Session) in 24th IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS), Costa Brava, Spain, DOI, PDF, Jul 2-4 2018. | |
| Victor M. van Santen, Javier Diaz-Fortuny, Hussam Amrouch, Javier Martin-Martinez,Rosana Rodriguez, Rafael Castro-Lopez, Elisenda Roca, Francisco V. Fernandez, Jörg Henkel and Montserrat Nafria Weighted Time Lag Plot Defect Parameter Extraction and GPU-based BTI Modeling for BTI Variability in IEEE 55th International Reliability Physics Symposium (IRPS), San Francisco , CA, USA, DOI, PDF, Mar 11-15 2018. | |
| Hussam Amrouch, Subrat Mishra, Victor M. van Santen, Souvik Mahapatra, Jörg Henkel Impact of BTI on Dynamic and Static Power: From the Physical to Circuit Level in IEEE/ACM 20th Design, Automation and Test in Europe Conference (DATE'17), Lausanne, Switzerland, DOI, PDF, Mar 27-31 2017. | |
| Victor M. van Santen, Hussam Amrouch, Javier Martin-Martinez, Montserrat Nafria, Jörg Henkel Designing Guardbands for Instantaneous Aging Effects in ACM/EDAC/IEEE 53rd Design Automation Conference (DAC'16), Austin, TX, USA, DOI, PDF, Jun 5-9 2016. | |
| Victor M. van Santen, Hussam Amrouch, Narendra Parihar, Souvik Mahapatra, Jörg Henkel Aging-Aware Voltage Scaling in IEEE/ACM 19th Design, Automation and Test in Europe Conference (DATE'16), Dresden, Germany, DOI, PDF, Mar 14-18 2016. | |
| Hussam Amrouch, Javier Martin-Martinez, Victor M. van Santen, Miquel Moras, Rosana Rodriguez, Montserrat Nafria and Jörg Henkel Connecting the Physical and Application Level Towards Grasping Aging Effects in IEEE 53rd International Reliability Physics Symposium (IRPS), Monterey, CA, USA, DOI, PDF, Apr 19-23 2015. | |
| Hussam Amrouch, Victor M. van Santen, Thomas Ebi, Volker Wenzel, Jörg Henkel Towards Interdependencies of Aging Mechanisms in IEEE/ACM 33rd International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA, DOI, PDF, Nov 3-6 2014. |
| Books / Book Chapter | |
|---|---|
| Victor M. van Santen, Hussam Amrouch, Thomas Wild, Jörg Henkel, Andreas Herkersdorf Thermal Management and Communication Virtualization for Reliability Optimization in MPSoCs Chapter in "Dependable Embedded Systems", Springer International Publishing, DOI, PDF, 2020. |
| Workshop | |
|---|---|
| Victor M. van Santen, Hussam Amrouch, Jörg Henkel
Modeling Short and Long-term Effects of Aging from the Defect to Application Level (invited presentation) in Workshop on System-to-Silicon Performance Modeling and Analysis at the ACM/EDAC/IEEE 53rd Design Automation Conference (DAC) , June 5-9 2016. |
Student Theses
| Name | Type of work | Title | Mentor | Completion date |
|---|---|---|---|---|
| List, Leon Felix | Bachelor thesis | Improved Aging Modeling for Circuit Reliability Evaluations | van Santen, Victor / Amrouch, Hussam | 2020-12-31 |
| Schillinger, Linda | Master thesis | The Impact of Self-Heating on Circuits | van Santen, Victor / Amrouch, Hussam | 2020-10-20 |
| Prinz, Jannik | Master thesis | Inferring Transistor Compact Models with Neural Networks | Amrouch, Hussam / van Santen, Victor | 2020-05-27 |
| Walner, Albert | Master thesis | Just-In-Time Compilation for the Circuit Simulator GPU-SPICE on the CUDA platform | van Santen, Victor / Amrouch, Hussam | 2019-09-27 |
| Thomann, Simon | Bachelor thesis | Reliability Analysis of SRAM Circuits in Conventional and Emerging Technologies | van Santen, Victor / Amrouch, Hussam | 2019-09-12 |
| Meinschäfer, Michael | Bachelor thesis | Modeling Self-Heating Dependencies in FinFET Transistors | van Santen, Victor / Amrouch, Hussam | 2019-05-17 |
| Banscher, Florian | Bachelor thesis | Modeling Self-Heating Effects in FinFET Technology | van Santen, Victor / Amrouch, Hussam | 2019-02-28 |
| Hamada, Islam | Bachelor thesis | High Performance Circuit Simulations | van Santen, Victor / Amrouch, Hussam | 2018-08-24 |
| Joe, Jerin | Internship | Dependable Hardware | Amrouch, Hussam / van Santen, Victor | 2018-05-31 |
| Klemme, Florian | Master thesis | Reliability Analysis of Circuits under Variability Effects | van Santen, Victor / Amrouch, Hussam | 2018-05-14 |
| Schneider, Nathanael | Bachelor thesis | High Performance Circuit Simulations | van Santen, Victor / Amrouch, Hussam | 2018-04-30 |
| Mishra, Subrat | Internship | Dependable Hardware | Amrouch, Hussam / van Santen, Victor | 2017-12-31 |
| Diep, Fu Lam Florian | Diploma thesis | High Performance Reliability Estimation of Circuits with CUDA | van Santen, Victor / Amrouch, Hussam | 2017-09-30 |
| Roether, Sebastian | Diploma thesis | A Novel Approach to Standard Cell Simulation in SPICE using Equivalence Classes | van Santen, Victor / Amrouch, Hussam | 2017-09-30 |
| Brinkmann, Sven | Diploma thesis | Fast, yet Accurate BTI Variability Evaluation at the Physical and Device Levels | van Santen, Victor / Amrouch, Hussam | 2017-07-06 |
| Bücher, Tim | Bachelor thesis | Measuring Aging-induced Degradation in Microprocessors | Amrouch, Hussam / van Santen, Victor | 2017-05-09 |
| Milev, Dimitar | Master thesis | GPU-based Implementation for State-of-the-Art MOSFET Compact Modelling | Amrouch, Hussam / van Santen, Victor | 2017-05-08 |
| Naqvi, Syed Mohsin Ali | Master thesis | Circuits Reliability | Amrouch, Hussam / van Santen, Victor | 2016-10-01 |
| Rostek, Daniela Jacinta | Student research project | Graphical User Interface for Reliability Estimation Tool | van Santen, Victor / Amrouch, Hussam | 2016-09-30 |
| Aazmi, Abdellatif | Internship | Evaluating Aging in Circuits | Amrouch, Hussam / van Santen, Victor | 2016-08-31 |
| Eisele, Max Camillo | Bachelor thesis | Fast, yet Accurate Implementation for Advanced Reliability Modeling | Amrouch, Hussam / van Santen, Victor | 2016-08-11 |
| Skinder, Michael | Master thesis | Evaluating the Mutual Influence between the Application and Physical Level on Reliability | Amrouch, Hussam / van Santen, Victor | 2016-03-07 |
| List, Christian | Diploma thesis | Evaluating the Impact of Applications on Simulating Aging Effects | Amrouch, Hussam / van Santen, Victor | 2016-03-07 |
| Bhat, Rajesh | Internship | CUDA Programming for Rapid Reliability Estimations | Amrouch, Hussam / van Santen, Victor | 2016-02-29 |
| Aqqad, Rami | Master thesis | OpenCL Programming for Circuits Reliability | Amrouch, Hussam / van Santen, Victor | 2015-12-01 |
| Khaleghi, Behnam | Internship | Reliability of SRAM Cells under different Physical Phenomena | Amrouch, Hussam / van Santen, Victor | 2014-09-30 |
