Magazine
Volume 34, Issue 1 (January/February)
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Highlights
| Special Issue on "3D-Test" |
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| Perspective by Mark Papermaster, "Developing Great Products for the Immersive Computing Era" |
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| Tutorial by Andy D. Pimentel, "Exploring Exploration: A Tutorial Introduction to Embedded Systems Design Space Exploration" |
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January/February 2017 Content
From the EIC
3D-Test
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Guest Editors' Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth Memory |
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View full article (PDF). |
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Unleashing Fury: A New Paradigm for 3-D Design and Test |
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This paper, based on an excellent keynote address by AMD's Jeff Rearick at 3D-TEST 2015, describes ... read more.
View full article (PDF). |
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High-Bandwidth Memory (HBM) Test Challenges and Solutions |
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TSV-based 3-D stacking enables large-capacity, power-efficient DRAMs with high bandwidth, such as specified by ... read more.
View full article (PDF). |
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High-Performance HBM Known-Good-Stack Testing |
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Based on Loranger's talk at 3D-TEST 2015, this article details the dedicated developments performed at probe-card supplier ... read more.
View full article (PDF). |
General Interest Papers
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Estimating the Impact of Methodology on Analog Integrated Circuit Design Time |
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The article discusses analog design practices and proposes a project management model for studying ... read more.
View full article (PDF). |
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Soft Error Mitigation Using Transmission Gate With Varying Gate and Body Bias |
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Soft errors not only are major threats to SRAM, but also have become a major threat to the reliability of logic circuits. This article proposes ... read more.
View full article (PDF). |
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A Comprehensive Design-for-Test Infrastructure in the Context of Security-Critical Applications |
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Testability is a perennial concern that requires ever-improved solutions; however, potentially resultant security vulnerabilities ... read more.
View full article (PDF). |
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Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms |
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Hardware-accelerated simulation platforms can significantly reduce the validation time. This article presents ... read more.
View full article (PDF). |
Departments
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Exploring Exploration: A Tutorial Introduction to Embedded Systems Design Space Exploration |
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View article (PDF). |
