The impending physical limits of CMOS technology lead to increasing process variability, thermal problems, degradation effects, and sensitivity for stochastic events. Designers of embedded systems have traditionally optimized circuits for speed, size, power and time to market. Recently however, the dependability of the system is emerging as a great concern to the modern designer. Undependability is related to Fabrication, Complexity, run-time effects as “Aging Effects”, “Thermal Effects”, “Soft Errors”, and “Permanent Errors”. Furthermore, these problems have been identified as the major challenge to be solved within the next decade.

In this semester our main focus is to study different research approaches to solve these problems in the field of Embedded Processor, and the new required architectural features for robust system design (reliability, failure tolerance, Signal Event Upset, error detection, recovery, and self-repair), and also (possibly) to propose new ideas regarding this topic.

Language: English.

Preliminary discussion: once registered, the student will be informed by email.

Application: via registration form.